Patentable/Patents/US-7315787
US-7315787

Multi-marker screening protocol for fetal abnormalities

PublishedJanuary 1, 2008
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

A method of assessing a pregnant woman's risk of having a fetus with a fetal abnormality by determining the fetus' BPD/OFD ratio and using the BPD/OFD ratio in conjunction with one or more other screening markers for the fetal abnormality. Also provided is a method of determining whether a pregnant woman is screen-positive or screen-negative by comparing the BPD/OFD ratio of the pregnant woman's fetus to a risk cut-off level.

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Patent Metadata

Filing Date

October 7, 2003

Publication Date

January 1, 2008

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Multi-marker screening protocol for fetal abnormalities — David Krantz | Patentable