A resin-encapsulated semiconductor device includes a semiconductor chip, a plurality of inner leads that are connected to a group of electrodes of the semiconductor chip, respectively, and an encapsulating resin that encapsulates a connection part located between the semiconductor chip and the inner leads. Each of the inner leads includes a protruded portion provided on a surface thereof on an outer side relative to the periphery of the semiconductor chip. The protruded portion protrudes in a thickness direction and is provided with a step portion formed in its side portion. The group of electrodes of the semiconductor chip is connected to surfaces of inner portions of the inner leads located on an inner side relative to their protruded portions, through electroconductive bumps, respectively. The encapsulating resin encapsulates the semiconductor chip and the electroconductive bumps and is formed to expose surfaces of the protruded portions. The surfaces of the protruded portions that function as external terminals can be reduced in size and thereby the pitch between the external terminals can be reduced.
Legal claims defining the scope of protection, as filed with the USPTO.
1. A method of producing a lead frame, comprising: forming a structure including a frame and a plurality of inner leads extending inward from the frame; half-etching or pressing a part of a surface of the inner lead to form a protruded portion on the surface; and then carrying out half-etching or pressing again from surroundings of a surface of the protruded portion to form a step portion on each of inner and outer side portions of the protruded portion.
2. A method of producing a resin-encapsulated semiconductor device, using a lead frame that includes a frame and a plurality of inner leads that extend inward from the frame, the inner lead having a protruded portion provided on a surface of an outer portion of the inner lead, and the protruded portion protruding in a thickness direction and being provided with a step portion formed on each of inner and outer side portions of the protruded portion, the method comprising: stacking a second semiconductor chip having a smaller size than that of a first semiconductor chip, on a surface of the first semiconductor chip, and electrically connecting a first group of electrodes of the first semiconductor chip with a group of electrodes of the second semiconductor chip through second electroconductive bumps; after that, electrically connecting a second group of electrodes of the first semiconductor chip with the inner leads through first electroconductive bumps; and encapsulating a region including surfaces of the first and second semiconductor chips and the first and second electroconductive bumps with an encapsulating resin with surfaces of the protruded portions being exposed from the encapsulating resin.
3. The method of producing a resin-encapsulated semiconductor device according to claim 2 , further comprising, after encapsulating the region, cutting off a portion sticking out from the encapsulating resin of the inner leads to separate a structure encapsulated with the resin from the frame.
4. The method of producing a resin-encapsulated semiconductor device according to claim 2 , wherein in encapsulating the region, the encapsulating resin is fed with a resin sheet being in close contact at least with the protruded portions.
5. A method of producing a resin-encapsulated semiconductor device, using a lead frame that includes a frame and a plurality of inner leads that extend inward from the frame, the inner lead having a protruded portion provided on a surface of an outer portion of the inner lead, and the protruded portion protruding in a thickness direction and being provided with a step portion formed on each of inner and outer side portions of the protruded portion, the method comprising: electrically connecting a second group of electrodes of a first semiconductor chip with the inner leads through first electroconductive bumps; after that, stacking a second semiconductor chip having a smaller size than that of the first semiconductor chip, on a surface of the first semiconductor chip, and electrically connecting a first group of electrodes of the first semiconductor chip with a group of electrodes of the second semiconductor chip through second electroconductive bumps; and encapsulating a region including surfaces of the first and second semiconductor chips and the first and second electroconductive bumps with an encapsulating resin with surfaces of the protruded portions being exposed from the encapsulating resin.
6. The method of producing a resin-encapsulated semiconductor device according to claim 5 , further comprising, after encapsulating the region, cutting off a portion sticking out from the encapsulating resin of the inner leads to separate a structure encapsulated with the resin from the frame.
7. The method of producing a resin-encapsulated semiconductor device according to claim 5 , wherein in encapsulating the region, the encapsulating resin is fed with a resin sheet being in close contact at least with the protruded portions.
8. A method of producing a resin-encapsulated semiconductor device, using a lead frame that includes a frame and a plurality of inner leads that extend inward from the frame, the inner lead having a protruded portion provided on a surface of an outer portion of the inner lead, and the protruded portion protruding in a thickness direction and being provided with a step portion formed on each of inner and outer side portions of the protruded portion, the method comprising: stacking a second semiconductor chip having a smaller size than that of a first semiconductor chip, on a surface of the first semiconductor chip, and electrically connecting a first group of electrodes of the first semiconductor chip with a group of electrodes of the second semiconductor chip through second electroconductive bumps; electrically connecting a second group of electrodes of the first semiconductor chip with the inner leads through first electroconductive bumps; and encapsulating a region including surfaces of the first and second semiconductor chips and the first and second electroconductive bumps with an encapsulating resin with surfaces of the protruded portions being exposed from the encapsulating resin.
9. The method of producing a resin-encapsulated semiconductor device according to claim 8 , further comprising, after encapsulating the region, cutting off a portion sticking out from the encapsulating resin of the inner leads to separate a structure encapsulated with the resin from the frame.
10. The method of producing a resin-encapsulated semiconductor device according to claim 8 , wherein in encapsulating the region, the encapsulating resin is fed with a resin sheet being in close contact at least with the protruded portions.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
March 27, 2006
July 29, 2008
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