An optical test head comprises one or more detectors for providing output signals indicative of the condition of a workpiece surface. Data from these detectors are stored in one or more memories only when the data from the detectors satisfy one or more conditions (e.g. the data exceed than a particular threshold). The data are then passed from the one or more memories to an electrical circuit for processing. In addition, location information is stored in one or more memories and passed on to the electrical circuit when the data from the detectors satisfy the one or more conditions.
Legal claims defining the scope of protection, as filed with the USPTO.
Claim text for this patent isn't available yet.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
April 23, 2005
September 16, 2008
Browse 5M+ US patents with plain-English claim translations and AI-generated analysis.