A growth plane of substrate 1 is processed to have a concavo-convex surface. The bottom of the concave part may be masked. When a crystal is grown by vapor phase growth using this substrate, an ingredient gas does not sufficiently reach the inside of a concave part 12, and therefore, a crystal growth occurs only from an upper part of a convex part 11. As shown in FIG. 1(b), therefore, a crystal unit 20 occurs when the crystal growth is started, and as the crystal growth proceeds, films grown in the lateral direction from the upper part of the convex part 11 as a starting point are connected to cover the concavo-convex surface of the substrate 1, leaving a cavity 13 in the concave part, as shown in FIG. 1(c), thereby giving a crystal layer 2, whereby the semiconductor base of the present invention is obtained. In this case, the part grown in the lateral direction, or the upper part of the concave part 12 has a low dislocation region and the crystal layer prepared has high quality. The manufacturing method of the semiconductor crystal of the present invention divides this semiconductor base into the substrate 1 and the crystal layer 2 at the cavity part thereof to give a semiconductor crystal.
Legal claims defining the scope of protection, as filed with the USPTO.
1. A method for manufacturing a semiconductor base comprising a substrate and a GaN group semiconductor crystal defined by Al x Ga 1-x-y In y N wherein 0≦x≦1 and 0≦y≦1, which is formed on the substrate by vapor phase growth, which method comprises: (a) preparing the substrate for crystal growth, wherein the substrate is made of sapphire (C-plane, A-plane, R-plane), SiC (6H, 4H, 3C), Si, Spinel, ZnO, GaAs, or NGO, and a crystal growth plane of the substrate is a plane having concave parts with a bottom surface formed by etching the original substrate, which consequently contains concaves and convexes formed by the concave parts and the remaining convex parts, and wherein the convex parts are of an interspersing island type, and (b) growing the GaN group semiconductor crystal from an upper part of the convex parts and from the bottom surface of the concave parts, respectively, such that the crystals grown laterally from the upper part of the convex parts and the crystals grown from the bottom surface of the concave parts are joined to cover the crystal growth plane of the substrate.
2. The method of claim 1 , wherein the GaN group semiconductor crystal is grown to fill the concave parts with the crystal.
3. The method of claim 1 , wherein not more than 50% of the crystal growth plane is an area occupied by the convex parts.
4. The method of claim 1 , wherein the GaN group semiconductor crystal is grown on the crystal growth plane via a buffer layer.
5. The method of claim 1 , wherein the GaN group semiconductor crystal is a GaN crystal.
6. A method for manufacturing a semiconductor base comprising a sapphire substrate and a GaN crystal formed on the substrate by vapor phase growth, which method comprises: (a) preparing the sapphire substrate for crystal growth, and a crystal growth plane of the substrate is a plane having concave parts with a bottom surface formed by etching the original substrate, which consequently contains concaves and convexes formed by the concave parts and the remaining convex parts, and wherein the convex parts are of an interspersing island type, and (b) growing, on the substrate via a buffer layer, the GaN crystal from an upper part of the convex parts and from the bottom surface of the concave parts, respectively, such that the crystals grown laterally from the upper part of the convex parts and the crystal grown from the bottom surface of the concave parts are joined to cover the crystal growth plane of the substrate.
7. The method of claim 6 , wherein the buffer layer is a GaN low temperature buffer layer.
8. A method for manufacturing a semiconductor base comprising a substrate and a GaN group semiconductor crystal defined by Al x Ga 1-x-y In y N wherein 0≦x≦1 and 0≦y≦1, which is formed on the substrate by vapor phase growth, which method comprises (a) preparing a substrate for crystal growth, wherein the substrate is made of sapphire (C-plane, A-plane, R-plane), SiC (6H, 4H, 3C), Si, Spinel, ZnO, GaAs, or NGO, and a crystal growth plane of the substrate is a plane having concave parts with a bottom surface formed by etching the original substrate, which consequently contains concaves and convexes formed by the concave parts and the remaining convex parts, wherein the convex parts are of a lattice type, and (b) growing the GaN group semiconductor crystal from an upper part of the convex parts and from the bottom surface of the concave parts, respectively, such that the crystals grown laterally from the upper part of the convex parts and the crystals grown from the bottom surface of the concave parts are joined to cover the crystal growth plane of the substrate.
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September 29, 2006
March 17, 2009
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