Semiconductor device

1. A semiconductor device comprising: a semiconductor chip having a first face and an edge; an insulating base film which has a semiconductor chip mounting face, the semiconductor chip mounting face facing the first face of the semiconductor chip with predetermined spacing; a plurality of first projecting electrodes formed in a first row on the first face of the semiconductor chip along the edge of the semiconductor chip; a plurality of second projecting electrodes formed in a second row on the first face of the semiconductor chip along the edge of the semiconductor chip, the plurality of second projecting electrodes being located between the edge of the semiconductor chip and the first row of first projecting electrodes, and a height of said second projecting electrode being smaller than a height of said first projecting electrode; a plurality of first inner leads extending on the semiconductor chip mounting face of the base film such that the plurality of first inner leads reach said plurality of first projecting electrodes respectively: an insulating film between the first inner leads and the first face of the semiconductor chip; and a plurality of second inner leads extending between the insulating film and the first face of the semiconductor chip such that the plurality of second inner leads reach said plurality of second projecting electrodes respectively, wherein the first and second inner leads are disposed on the same side of the insulating base film.

2. The semiconductor device according to claim 1 , wherein said plurality of first projecting electrodes and said plurality of second projecting electrodes are arranged in a staggered fashion.

3. The semiconductor device according to claim 1 , wherein said plurality of first projecting electrodes and said plurality of second projecting electrodes are arranged side by side respectively.

4. The semiconductor device according to claim 1 , further comprising: a plurality of first outer leads connected with said plurality of first inner leads respectively, and formed on the semiconductor chip mounting face of the base film outside the first and second inner leads; and a plurality of second outer leads connected with said plurality of second inner leads respectively, and formed on said insulating film, wherein tips of the first outer leads extend beyond tips of the second outer leads.

5. The semiconductor device according to claim 1 , wherein the insulating film is solder resist.

6. The semiconductor device according to claim 1 , wherein the base film has a plurality of first sprocket holes formed along a first longitudinal side thereof and a plurality of second sprockets holes formed along a second longitudinal side thereof.

7. The semiconductor device according to claim 1 , wherein the second inner leads overlap the first inner leads with the insulating film being interposed therebetween.

8. A semiconductor device comprising: a semiconductor chip having a first face and an edge; an insulating base film which has a semiconductor chip mounting face, the semiconductor chip mounting face facing the first face of the semiconductor chip with predetermined spacing; a plurality of first projecting electrodes formed in a first row on the first face of the semiconductor chip along the edge of the semiconductor chip; a plurality of second projecting electrodes formed in a second row on the first face of the semiconductor chip along the edge of the semiconductor chip, the plurality of second projecting electrodes being located between the edge of the semiconductor chip and the first row of first projecting electrodes, and a height of said second projecting electrode being smaller than a height of said first projecting electrode; a plurality of first inner leads extending on the semiconductor chip mounting face of the base film such that the plurality of first inner leads reach said plurality of first projecting electrodes respectively; an insulating film between the first inner leads and the first face of the semiconductor chip; and a plurality of second inner leads extending between the insulating film and the first face of the semiconductor chip such that the plurality of second inner leads reach said plurality of second projecting electrodes respectively, wherein the insulating film and the insulating base film are two separate elements, and the insulating film is disposed between the insulating base film and the semiconductor chip.

9. The semiconductor device according to claim 8 , wherein said plurality of first projecting electrodes and said plurality of second projecting electrodes are arranged in a staggered fashion.

10. The semiconductor device according to claim 8 , wherein said plurality of first projecting electrodes and said plurality of second projecting electrodes are arranged side by side respectively.

11. The semiconductor device according to claim 8 , further comprising: a plurality of first outer leads connected with said plurality of first inner leads respectively, and formed on the semiconductor chip mounting face of the base film outside the first and second inner leads; and a plurality of second outer leads connected with said plurality of second inner leads respectively, and formed on said insulating film, wherein tips of the first outer leads extend beyond tips of the second outer leads.

12. The semiconductor device according to claim 8 , wherein the insulating film is solder resist.

13. The semiconductor device according to claim 8 , wherein the base film has a plurality of first sprocket holes formed along a first longitudinal side thereof and a plurality of second sprockets holes formed along a second longitudinal side thereof.

14. The semiconductor device according to claim 8 , wherein the second inner leads overlap the first inner leads with the insulating film being interposed therebetween.