Providing distinction between overlapping state distributions of one or more multi cell memory devices is described herein. By way of example, a system can include a calculation component that can perform a mathematical operation on an identified, non-overlapped bit distribution and an overlapped bit distribution associated with the memory cell. Such mathematical operation can produce a resulting distribution that can facilitate identification by an analysis component of at least one overlapped bit distribution associated with cells of the one or more multi cell memory devices. Consequently, read errors associated with overlapped bits of a memory cell device can be mitigated.
Legal claims defining the scope of protection, as filed with the USPTO.
1. A system that distinguishes between overlapping state distributions of a plurality of multi-cell memory devices, comprising: a calculation component that performs a mathematical operation on two or more state distributions of a plurality of multi-cell memory devices, and generates a resulting distribution; and an analysis component that employs the resulting distribution in connection with distinguishing between overlapping state distributions of the plurality of multi-cell memory devices.
2. The system of claim 1 , the resulting distribution is a third state distribution, different from the two or more state distributions.
3. The system of claim 1 , the mathematical operation adds or subtracts the two or more state distributions with each other.
4. The system of claim 1 , each state distribution of the two or more state distributions corresponds to a group of memory cells that are adjacent to each of the other groups of memory cells and corresponding state distributions.
5. The system of claim 1 , the two or more state distributions are related by at least one logical or mathematical relationship.
6. The system of claim 5 , the logical or mathematical relationship specifies that adjacent cells will have program values with substantially equivalent relative positions on state distributions corresponding to each of the adjacent cells.
7. The system of claim 5 , the logical relationship specifies that adjacent cells will have program values with substantially opposite relative positions on state distributions corresponding to each of the adjacent cells.
8. The system of claim 1 , the resulting distribution has a dispersity that is smaller than dispersities associated with at least one of the two or more state distributions.
9. A system that distinguishes between overlapping state distributions of a plurality of multi-cell memory devices, comprising: means for mathematically operating on two or more state distributions of a plurality of multi-cell memory devices to provide a resulting distribution; and means for identifying a state associated with state distributions of at least one cell of the multi-cell memory device based on the resulting distribution.
10. The system of claim 9 , comprising means for providing a reference value that can be used to uniquely identify a state of non overlapping state distributions associated with common cells of a plurality of multi-cell memory devices.
11. The system of claim 9 , comprising means for measuring that can identify a value of a programmable electrical characteristic associated with each cell of each of the plurality of multi-cell memory devices.
12. The system of claim 11 , the value relates to a state of each cell.
13. The system of claim 11 , the programmable electrical characteristic includes a current or a voltage, or both, associated with each cell.
14. The system of claim 9 , comprising means for adjusting state distribution values that can shift state distributions associated with a state of the plurality of multi-cell memory devices, by changing a default program value associated with the state to a new program value, and reprogramming cells in accord with the new program value.
15. The system of claim 14 , the means for adjusting can specify what other distributions are overlapped, if any, by distributions associated with the at least one common cell state by shifting state distributions.
16. A method for distinguishing potentially overlapping state distributions of a plurality of multi-cell memory devices, comprising: identifying a program state of a non-overlapped state distribution of a plurality of multi-cell memory devices; adding or subtracting the non-overlapped state distribution and an overlapped state distribution to form a resulting distribution; and identifying a program state of the overlapped state distribution or a related overlapped state distribution, or both, from the resulting distribution.
17. The method of claim 16 , further comprising at least one of: shifting a first set of state distributions corresponding to a first program state to facilitate the identifying the program state of the non-overlapped state distribution; or programming a cell of the plurality of multi-cell memory devices in a manner that enforces a logical relationship between the cell and at least one adjacent cell.
18. The method of claim 16 , the non-overlapped state distribution and the overlapped state distribution are related by a logical relationship.
19. The method of claim 18 , the logical relationship specifies that program values of cells associated with the non-overlapped state distribution have either substantially equal or substantially opposite relative positions compared with program values of cells associated with the overlapped distribution.
20. The method of claim 16 , further comprising measuring each cell of a plurality of multi-cell memory devices to determine program values of the cells corresponding to one of two or more possible program states and generating state distributions from the measured program values, each state distribution corresponds to program states of a common group of cells and groups of cells adjacent to such common group.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
December 14, 2007
October 13, 2009
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