End of line performance prediction

1. A method, comprising: determining a predicted end of line parameter relating to a workpiece; storing said predicted end of line parameter; and providing an interface for accessing said predicted end of line parameter; and performing at least one of prioritizing a process task to be performed upon said workpiece, scheduling a process step to be performed upon said workpiece, routing said workpiece, or modifying a control parameter of a process step to be performed upon said workpiece, based upon accessing said predicted end of line parameter; and processing said workpiece using at least one of the prioritized process task, the scheduled process step, the routing, or the modified control parameter.

2. The method of claim 1 , wherein determining a predicted end of line parameter relating to a workpiece comprises determining the predicted end of line parameter relating to a semiconductor wafer.

3. The method of claim 1 , wherein determining said predicted end of line parameter relating to said workpiece further comprises: identifying an end of line parameter; correlating said end of line parameter to a corresponding inline process step; acquiring metrology data relating to said inline process step; and modeling said end of line parameter based upon said inline process step and said metrology data.

4. The method of claim 1 , wherein storing said predicted end of line parameter further comprises storing said predicted end of line parameter into a database.

5. The method of claim 1 , wherein storing said predicted end of line parameter further comprises providing data relating to said predicted end of line parameter in a graphical illustrative form.

6. The method of claim 1 , further comprising providing a web-based access to data relating to said predicted end of line parameter.

7. The method of claim 1 , further comprising providing access to said end of line parameter to at least one of a scheduling system, a routing system, and a prioritization system.

8. The method of claim 1 , further comprising processing a subsequent workpiece.

9. A method, comprising: determining a predicted end of line parameter relating to a workpiece; identifying a process step capable of affecting said predicted end of line parameter; modeling said predicted end of line parameter based upon an analysis of said process step, to generate the predicted end of line parameter; and storing said predicted end of line parameter for access in a graphically illustrative form.

10. The method of claim 9 , wherein storing said predicted end of line parameter comprises providing data relating to said predicted end of line in a graphically illustrative format.

11. The method of claim 9 , further comprising processing a subsequent workpiece.

12. A method, comprising: performing a first process upon a workpiece; receiving metrology data relating to said workpiece; modeling an end of line parameter associated with said workpiece based upon an analysis of said first process, to generate a predicted end of line parameter; and determining at least one of a routing, scheduling, and a prioritization parameter relating to performing a second process upon said workpiece based upon said predicted end of line parameter.

13. The method of claim 12 , further comprising processing a subsequent workpiece.

14. A method, comprising: performing a first process upon a workpiece; determining if said first process is a critical process; acquiring metrology data relating to said first process based upon said determination that said first process is a critical process; determining a post process parameter relating to said metrology data; and modeling said post process parameter to generate a modeled post process parameter; and providing access to said modeled post process parameter.

15. The method of claim 14 , further comprising processing a subsequent workpiece.

16. The method of claim 14 , wherein providing access to said modeled post process parameter comprises providing remote access to said modeled post process parameter.

17. The method of claim 14 , wherein providing access to said modeled post process parameter comprises providing web-based access to said modeled post process parameter.

18. A system, comprising: a first controller to control a first process and a second process operation performed upon a workpiece; a second controller to determine a predicted end of line parameter based upon at least one of said first and second process operations and store said predicted end of line parameter into a database, the second controller to also perform an adjustment of at least one of a routing, scheduling, and a prioritization relating to performing a second process upon said workpiece; and a processing tool operatively coupled with said first controller, said processing tool to process said workpiece.

19. The system of claim 18 , further comprising a database to store said predicted end of line parameter.

20. The system of claim 18 , further comprising a device to display said predicted end of line parameter in a graphical illustration format.

21. The system of claim 18 , wherein said processing tool to process a subsequent workpiece.

22. The system of claim 18 , wherein said first controller is a central control unit capable of controlling a plurality of process units, said plurality of process units each comprising at least one processing tool, a metrology tool, and a tool controller for controlling at least one of said processing tool and said metrology tool.

23. The system of claim 18 , wherein said workpiece is a semiconductor wafer.

24. An apparatus, comprising: a controller to determine a predicted end of line parameter based upon at least one of a first and a second process operation performed on a workpiece and store said predicted end of line parameter into a database, the controller to also perform an adjustment of at least one of a routing, a scheduling, and a prioritization relating to performing said second process operation upon said workpiece.

25. The apparatus of claim 24 , wherein said workpiece is a semiconductor wafer.

26. The apparatus of claim 24 , wherein controller is capable of providing said end of line parameter in a graphical illustrative format.

27. An apparatus, comprising: means for determining a predicted end of line parameter relating to a workpiece; means for storing said predicted end of line parameter for access; and means for providing an interface for accessing said predicted end of line parameter; and means for performing at least one of a prioritization of process task, a scheduling of a process step to be performed upon said workpiece, a routing of said workpiece, or modifying a control parameter for performing a process step upon said workpiece, based upon accessing said predicted end of line parameter.

28. A computer readable program storage device encoded with instructions that, when executed by a computer, performs a method, comprising: determining a predicted end of line parameter relating to a workpiece; storing said predicted end of line parameter for access; and providing an interface for accessing said predicted end of line parameter.

29. The computer readable program storage device encoded with instructions that, when executed by a computer, performs the method of claim 28 , further comprising accessing said predicted end of line parameter to perform at least one of a prioritization of process task, scheduling of a process step to be performed upon said workpiece, routing of said workpiece, and modifying a control parameter for performing a process step upon said workpiece.

30. The computer readable program storage device encoded with instructions that, when executed by a computer, performs the method of claim 28 , wherein determining said predicted end of line parameter relating to said workpiece further comprises: identifying an end of line parameter; correlating said end of line parameter to a corresponding inline process step; acquiring metrology data relating to said inline process step; and modeling said end of line parameter based upon said inline process step and said metrology data.

31. The computer readable program storage device encoded with instructions that, when executed by a computer, performs the method of claim 28 , wherein storing said predicted end of line parameter further comprises storing said predicted end of line parameter into a database.

32. The computer readable program storage device encoded with instructions that, when executed by a computer, performs the method of claim 28 , further comprising providing access to said end of line parameter to at least one of a scheduling system, a routing system, and a prioritization system.

33. The computer readable program storage device encoded with instructions that, when executed by a computer, performs the method of claim 28 , further comprising processing a subsequent workpiece.