A cerium oxide abrasive slurry having, dispersed in a medium, cerium oxide particles whose primary particles have a median diameter of from 30 nm to 250 nm, a maximum particle diameter of 600 nm or smaller, and a specific surface area of from 7 to 45 m.2/g, and slurry particles have a median diameter of from 150 nm to 600 nm. The cerium oxide particles have structural parameter Y, representing an isotropic microstrain obtained by an X-ray Rietveld method (with RIETAN-94), of from 0.01 to 0.70, and structural parameter X, representing a primary particle diameter obtained by an X-ray Rietveld method (with RIETAN-94), of from 0.08 to 0.3. The cerium oxide abrasive slurry is made by a method of obtaining particles by firing at a temperature of from 600° C. to 900° C. and then pulverizing, then dispersing the resulting cerium oxide particles in a medium.
Legal claims defining the scope of protection, as filed with the USPTO.
1. A cerium oxide abrasive, comprising: a slurry comprising a medium and cerium oxide slurry particles dispersed in the medium, the cerium oxide slurry particles including cerium oxide primary particles that have a median diameter of from 30 nm to 250 nm, wherein the cerium oxide slurry particles have a median diameter of from 150 nm to 600 nm as measured using laser diffraction with the cerium oxide slurry particles dispersed in the medium, and wherein the cerium oxide slurry particles include a plurality of cerium oxide primary particles, wherein the cerium oxide slurry particles have a zeta potential of from −100 mV to −10 mV in said slurry.
2. The cerium oxide abrasive according to claim 1 , wherein said cerium oxide slurry particles have a median diameter of from 200 nm to 400 nm.
3. The cerium oxide abrasive according to claim 1 , wherein said primary particles have a median diameter of from 100 nm to 250 nm and said cerium oxide slurry particles have a median diameter of from 150 nm to 350 nm.
4. The cerium oxide abrasive according to claim 1 , wherein said primary particles have a median diameter of from 30 nm to 70 nm and said cerium oxide slurry particles have a median diameter of from 250 nm to 600 nm.
5. The cerium oxide abrasive according to claim 1 , wherein the medium includes water and a dispersing agent, wherein the dispersing agent is in an amount ranging from 0.01 parts to 5 parts, by weight, based on 100 parts, by weight, of cerium oxide particles.
6. The cerium oxide abrasive according to claim 5 , wherein the dispersing agent comprises ammonium polyacrylate.
7. The cerium oxide abrasive according to claim 6 , wherein the ammonium polyacrylate has a weight-average molecular weight ranging from 5,000 to 20,000.
8. A cerium oxide abrasive suitable for polishing an inorganic insulating film layer, comprising: a slurry comprising a medium and cerium oxide slurry particles dispersed in the medium, the cerium oxide slurry particles including cerium oxide primary particles that have a median diameter of from 30 nm to 250 nm, wherein the cerium oxide slurry particles have a median diameter of from 150 nm to 600 nm as measured using laser diffraction with the cerium oxide slurry particles dispersed in the medium, and wherein the cerium oxide slurry particles include a plurality of cerium oxide primary particles, wherein the cerium oxide slurry particles have a zeta potential of from −100 mV to −10 mV in said slurry, wherein the cerium oxide abrasive is suitable for polishing an inorganic insulating film layer, and wherein the content of alkali metals and halogens of the abrasive is 1 ppm or less.
9. A cerium oxide abrasive according to claim 8 , wherein the cerium oxide abrasive does not contain more than 1 ppm of each of the elements of the group comprising Na, K, Si, Mg, Ca, Zr, Ti, Ni, Cr and Fe; and the cerium oxide abrasive does not contain more than 10 ppm of Al.
10. The cerium oxide abrasive according to claim 8 , wherein the medium includes water and a dispersing agent, wherein the dispersing agent is in an amount ranging from 0.01 parts to 5 parts, by weight, based on 100 parts, by weight, of cerium oxide particles.
11. A cerium oxide abrasive suitable for polishing a SiO 2 film or a phosphorous or boron doped SiO 2 film, comprising: a slurry comprising a medium and cerium oxide slurry particles dispersed in the medium, the cerium oxide slurry particles including cerium oxide primary particles that have a median diameter of from 10 nm to 100 nm, wherein the cerium oxide slurry particles have a median diameter of from 150 nm to 600 nm as measured using laser diffraction with the cerium oxide slurry particles dispersed in the medium, and wherein the cerium oxide slurry particles include a plurality of cerium oxide primary particles, wherein the cerium oxide slurry particles have a zeta potential of from −100 mV to −10 mV in said slurry, and wherein the cerium oxide abrasive is suitable for polishing a SiO 2 film or a phosphorous or boron doped SiO 2 film.
12. The cerium oxide abrasive according to claim 11 , wherein the medium includes water and a dispersing agent, wherein the dispersing agent is in an amount ranging from 0.01 parts to 5 parts, by weight, based on 100 parts, by weight, of cerium oxide particles.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
October 12, 2004
May 4, 2010
Browse 5M+ US patents with plain-English claim translations and AI-generated analysis.