Patentable/Patents/US-8263933
US-8263933

Device and method for analyzing an organic sample

PublishedSeptember 11, 2012
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

A device and method for analyzing an organic sample provide high spatial resolution. A focused ion beam is directed onto the organic sample. Fragments detached from the sample are examined using mass spectroscopy.

Patent Claims

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Classification Codes (CPC)

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G01N
Patent Metadata

Filing Date

September 2, 2009

Publication Date

September 11, 2012

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