Patentable/Patents/US-8653865
US-8653865

Voltage change detection device

PublishedFebruary 18, 2014
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

A voltage change detection device is provided, which can reduce a deviation of a detection potential and can detect a voltage change within a predetermined detection potential even when the threshold voltage of a field effect transistor is deviated. The voltage change detection device includes a first field effect transistor, a second field effect transistor, and a detection signal generator. The first field effect transistor has a drain connected to a power supply potential, a source connected to a first constant current source or a first resistor at a first node, and a gate connected to a fixed voltage. The second field effect transistor has a drain and a gate connected to the power supply potential and a source connected to a second constant current source or a second resistor at a second node. The detection signal generator generates a detection signal indicating that the power supply potential has crossed a predetermined detection potential according to a comparison between a voltage at the first node and a voltage at the second node.

Patent Claims
10 claims

Legal claims defining the scope of protection, as filed with the USPTO.

1

1. A voltage change detection device comprising: a reference potential generator adapted to generate a reference potential based on a power supply potential; a comparison potential generator adapted to generate a comparison potential based on the power supply potential; and a detection signal generator that generates adapted to generate a detection signal indicating that the power supply potential has changed to cross a predetermined detection potential according to a comparison between the reference potential and the comparison potential, wherein the reference potential generator includes one of a first resistor and a first constant current source connected to a ground potential and a first field effect transistor having a drain connected to the power supply potential, a source connected to the one of the first resistor and the first constant current source at a first node, and a gate connected to a fixed voltage, wherein the comparison potential generator includes one of a second resistor and a second constant current source connected to the ground potential and a second field effect transistor having a drain and a gate connected to the power supply potential and a source connected to the one of the second resistor and the second constant current source at a second node, and wherein the detection signal generator generates the detection signal using a voltage at the first node as the reference potential and using a voltage at the second node as the comparison potential, wherein the fixed voltage is the ground potential.

2

2. The voltage change detection device according to claim 1 , wherein the first field effect transistor is a depletion type NMOS transistor and the second field effect transistor is an enhancement type NMOS transistor.

3

3. The voltage change detection device according to claim 1 , wherein the voltage change detection device generates the detection signal when the comparison potential is higher than the reference potential.

4

4. The voltage change detection device according to claim 2 , wherein the voltage change detection device generates the detection signal when the comparison potential is higher than the reference potential.

5

5. A voltage change detection device comprising: a reference potential generator that generates a reference potential based on a power supply potential; a comparison potential generator adapted to generate a comparison potential based on the power supply potential; and a detection signal generator adapted to generate a detection signal indicating that the power supply potential has changed to cross a predetermined detection potential according to a comparison between the reference potential and the comparison potential, wherein the reference potential generator includes one of a first resistor and a first constant current source connected to a ground potential and a first field effect transistor having a drain connected to the power supply potential, a source connected to the one of the first resistor and the first constant current source at a first node, and a gate connected to a fixed voltage, wherein the comparison potential generator includes one of a second resistor and a second constant current source connected to the ground potential, at least two second field effect transistors, each having a source connected to the one of the second resistor and the second constant current source at a second node, and at least two switches connected between the power supply potential and respective gates and drains of the second field effect transistors, and wherein the detection signal generator is adapted to generate the detection signal using a voltage at the first node as the reference potential and using a voltage at the second node as the comparison potential, and wherein the fixed voltage is the ground potential.

6

6. The voltage change detection device according to claim 5 , wherein the first field effect transistor is a depletion type NMOS transistor and the second field effect transistor is an enhancement type NMOS transistor.

7

7. The voltage change detection device according to claim 5 , wherein the voltage change detection device generates the detection signal when the comparison potential is higher than the reference potential.

8

8. The voltage change detection device according to claim 6 , wherein the voltage change detection device generates the detection signal when the comparison potential is higher than the reference potential.

9

9. The voltage change detection device according to claim 5 , wherein gate lengths or gate widths of the second field effect transistors are different from each other.

10

10. The voltage change detection device according to claim 6 , wherein gate lengths or gate widths of the second field effect transistors are different from each other.

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Patent Metadata

Filing Date

October 26, 2010

Publication Date

February 18, 2014

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