Patentable/Patents/US-8705176
US-8705176

Modified Michelson delay-line interferometer

PublishedApril 22, 2014
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

In an optical etalon with a fixed FSR determined by the cavity length, the time delay is adjusted by an etalon surface coating. The proper cavity length is chosen to achieve a desired FSR, and the coating is independently selected to obtain a desired time delay.

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Patent Metadata

Filing Date

December 6, 2010

Publication Date

April 22, 2014

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