An apparatus for determining at least one centroid location for a contact at a touch-sensing surface may include a first slave controller coupled to a first capacitive touch panel comprising a first plurality of sensor elements, where the first slave controller is configured to measure a first set of capacitance values for a plurality of intersections of the first plurality of sensor elements, and a master controller coupled with the first slave controller, where the master controller is configured to receive the first set of capacitance values and calculate a first centroid position of a contact based on the first set of capacitance values and a second set of capacitance values.
Legal claims defining the scope of protection, as filed with the USPTO.
1. An apparatus, comprising: a first slave controller coupled to a first capacitive touch panel comprising a first plurality of sensor elements, wherein the first slave controller is configured to: measure a first set of capacitance values for a plurality of intersections of the first plurality of sensor elements, in response to determining that the first set of capacitance values indicates a contact not within a predetermined distance from a first edge of the first capacitive touch panel, calculate a first centroid position of the contact based on the first set of capacitance values, and in response to determining that the contact is within the predetermined distance from the first edge of the first capacitive touch panel, transmit the first set of capacitance values to a master controller; and the master controller, coupled with the first slave controller and configured to receive the first set of capacitance values and to calculate the first centroid position of the contact based on the first set of capacitance values measured from the first capacitive touch panel and a second set of capacitance values measured from a second capacitive touch panel, wherein a space between the two capacitive touch panels is small enough such that the contact at a single location can affect capacitance values for both panels simultaneously, wherein the first and the second sets of capacitance values are measured while the contact is simultaneously affecting capacitance values for both panels, and wherein the first edge of the first capacitive touch panel is adjacent to a second edge of the second capacitive touch panel.
2. The apparatus of claim 1 , wherein the first slave controller is further configured to measure the first set of capacitance values from intersections near an edge of the first capacitive touch panel.
3. The apparatus of claim 2 , wherein the second set of capacitance values are measured from intersections near the second edge of the second capacitive touch panel adjacent to the first edge of the first capacitive touch panel.
4. The apparatus of claim 3 , further comprising a display, wherein the display comprises the first capacitive touch panel and the second capacitive touch panel.
5. The apparatus of claim 1 , wherein the first slave controller is further configured to: measure a third set of capacitance values from a set of intersections away from the first edge of the first capacitive touch panel; calculate a second centroid position of a contact at the first capacitive touch panel based on the third set of capacitance values; and transmit the second centroid position to the master controller.
6. The apparatus of claim 1 , further comprising a second slave controller coupled with the master controller, wherein the second slave controller is coupled with the second capacitive touch panel adjacent to the first capacitive touch panel, the second capacitive touch panel comprising a second plurality of sensor elements, and wherein the second slave controller is configured to measure a capacitance for each of a plurality of intersections of the second plurality of sensor elements.
7. The apparatus of claim 6 , wherein the second slave controller is configured to transmit the second set of capacitance values to the master controller.
8. The apparatus of claim 6 , wherein the second slave controller is configured to: measure a fourth set of capacitance values from a set of intersections away from the second edge of the second capacitive touch panel; calculate a third centroid position of a contact at the second capacitive touch panel based on the fourth set of capacitance values; and transmit the third centroid position to the master controller.
9. The apparatus of claim 1 , wherein the master controller is coupled with the second capacitive touch panel adjacent to the first capacitive touch panel, and wherein the master controller is configured to measure a capacitance for each of a plurality of intersections of a second plurality of sensor elements of the second capacitive touch panel.
10. The apparatus of claim 1 , wherein the master controller is configured to transmit to a host processor a plurality of centroid positions including the first centroid position.
11. A method, comprising: measuring a first set of capacitance values for a plurality of intersections of a first plurality of sensor elements in a first capacitive touch panel; in response to determining that the first set of capacitance values indicates a contact not within a predetermined distance from a first edge of the first capacitive touch panel, calculating a first centroid position of the contact based on the first set of capacitance values at a slave controller; and in response to determining that the contact is within the predetermined distance from the first edge of the first capacitive touch panel: transmitting the first set of capacitance values from the slave controller to a master controller, measuring a second set of capacitance values for a plurality of intersections of a second plurality of sensor elements in a second capacitive touch panel adjacent to the first capacitive touch panel; wherein the first edge of the first capacitive touch panel is adjacent to a second edge of the second capacitive touch panel; receiving the first set of capacitance values and the second set of capacitance values at the master controller; wherein a space between the two capacitive touch panels is small enough such that the contact at the single location can affect capacitance values on both panels simultaneously, wherein the first and the second sets of capacitance values are measured while the contact is simultaneously affecting capacitance values for both panels; and using the master controller to calculate the first centroid position of a contact based on the first set of capacitance values and the second set of capacitance values.
12. The method of claim 11 , wherein the first set of capacitance values is measured from intersections near the first edge of the first capacitive touch panel.
13. The method of claim 12 , wherein the second set of capacitance values are measured from intersections near the second edge of the second capacitive touch panel adjacent to the first edge of the first capacitive touch panel.
14. The method of claim 11 , further comprising: measuring a third set of capacitance values from a set of intersections away from the first edge of the first capacitive touch panel; calculating a second centroid position of a contact at the first capacitive touch panel based on the third set of capacitance values; and transmitting the second centroid position to the master controller.
15. The method of claim 11 , further comprising measuring a capacitance for each of a plurality of intersections of the second plurality of sensor elements.
16. The method of claim 15 , further comprising transmitting the second set of capacitance values to the master controller.
17. The method of claim 15 , further comprising: measuring a fourth set of capacitance values from a set of intersections away from the second edge of the second capacitive touch panel; calculating a third centroid position of a contact at the second capacitive touch panel based on the fourth set of capacitance values; and transmitting the third centroid position to the master controller.
18. The method of claim 11 , further comprising using the master controller to measure a capacitance for each of a plurality of intersections of the second plurality of sensor elements.
19. The method of claim 11 , further comprising transmitting to a host processor a plurality of centroid positions including the first centroid position.
20. The method of claim 11 , wherein a single display comprises the first capacitive touch panel and the second capacitive touch panel.
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March 25, 2011
August 19, 2014
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