Systems and methods for single cell product path delay analysis

1. A method, comprising: designing a product using a model from an initial test site; creating performance path tests for one or more paths on the product; measuring performance path parameters of the product; and determining that the measured performance path parameters match predicted performance path parameters, wherein the determining that the measured performance path parameters match predicted performance path parameters comprises: conducting a regression analysis; inputting identified sensitivity input into a canonical model; and comparing the regression analysis with a timing analysis.

2. The method of claim 1 , wherein the product comprises structures used to conduct parametric measurements.

3. The method of claim 1 , wherein the creating the performance path tests comprises determining at least one of a path delay and a frequency of a selected path as a function of a process window sigma for the at least one of the path delay and the frequency.

4. The method of claim 3 , wherein the determining at least one of the path delay and the frequency of a selected path as a function of a process window sigma provides the expected performance path parameters.

5. The method of claim 1 , further comprising determining a process window sigma for each die of the product.

6. The method of claim 1 , wherein the comparing the regression analysis with the timing analysis comprises comparing chip parameter sensitivities with a timing methodology.

7. The method of claim 6 , wherein the chip parameter sensitivities comprise both process parameters and environmental parameters including temperature, voltage, and aging.

8. The method of claim 7 , wherein the chip parameter sensitivities are measured in sigmas of a distribution.