Patentable/Patents/US-8947204
US-8947204

Optical interrogation and registration system

PublishedFebruary 3, 2015
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

A system and method for identifying an object are provided. An encoded substrate includes at least one layer of material having a matrix of zones arranged on surface thereof to represent optically coded information. At least one zone of the matrix of zones is configured to absorb a predetermined first wavelength of an electromagnetic radiation. A scanner is configured to receive a reflected electromagnetic radiation associated with the matrix of zones. The optically coded information is extracted from the reflected electromagnetic radiation.

Patent Claims
19 claims

Legal claims defining the scope of protection, as filed with the USPTO.

1

1. A method of identifying an object, said method comprising: receiving reflected electromagnetic radiation associated with a substrate that includes a first layer having a first matrix of zones and a second layer having a second matrix of zones, the second matrix of zones being directly below the first matrix of zones, wherein the substrate is coupled to the object to represent optically coded information associated with the object, and at least one zone of the first matrix of zones or the second matrix of zones is configured to absorb a predetermined first wavelength from electromagnetic radiation; extracting the optically coded information from a pattern created by wavelengths associated with the reflected electromagnetic radiation; and calibrating a layer, of said substrate, having a second spatial resolution that is greater than the first spatial resolution wherein the first matrix of zones and the second matrix of zones have a first spatial resolution.

2

2. A method in accordance with claim 1 further comprising: transmitting the first wavelength of the electromagnetic radiation at a first time; and transmitting a predetermined second wavelength of the electromagnetic radiation at a second time, wherein at least one zone of the second matrix of zones is configured to absorb the second wavelength of the electromagnetic radiation.

3

3. A method in accordance with claim 1 , wherein at least one zone of the first matrix of zones or the second matrix of zones is configured to absorb a predetermined second wavelength from the electromagnetic radiation.

4

4. A method in accordance with claim 1 , wherein at least one zone of the first matrix of zones and the second matrix of zones is transmissive to a defined range of wavelengths from the electromagnetic radiation.

5

5. An encoded substrate comprising a first layer of material having a first matrix of zones arranged on a surface thereof and a second layer of material having a second matrix of zones arranged on a surface of the second layer such that the second matrix of zones are directly below the first matrix of zones, the first matrix of zones and the second matrix of zones representing optically coded information, wherein at least one zone of the first matrix of zones or the second matrix of zones is configured to absorb a predetermined first wavelength from electromagnetic radiation, such that the optically coded information can be obtained from a pattern of wavelengths associated with a reflection of the electromagnetic radiation, and wherein the first matrix of zones and the second matrix of zones have a first spatial resolution, and said encoded substrate further comprises a calibrating layer having a second spatial resolution that is greater than the first spatial resolution.

6

6. An encoded substrate in accordance with claim 5 further comprising a base layer extending under said second layer of material, wherein said base layer is configured to reflect the electromagnetic radiation.

7

7. An encoded substrate in accordance with claim 5 further comprising a base layer extending under said second layer of material, wherein said base layer is configured to reflect a first electromagnetic radiation emitted from a first source and a second electromagnetic radiation emitted from a second source in a common direction.

8

8. An encoded substrate in accordance with claim 5 further comprising a base layer extending under said second layer of material, wherein said base layer is configured to reflect the electromagnetic radiation towards a source of the electromagnetic radiation.

9

9. An encoded substrate in accordance with claim 5 , wherein said at least one zone is configured to indicate a change to at least one of the substrate and an environment of the substrate.

10

10. An encoded substrate in accordance with claim 5 further comprising at least one of a tamper evident layer and a tamper proof layer.

11

11. A system for identifying an object, said system comprising: a substrate comprising a first layer of material having a first matrix of zones arranged on a surface thereof and a second layer of material having a second matrix of zones arranged on a surface of the second layer such that the second matrix of zones are directly below the first matrix of zones, the first matrix of zones and the second matrix of zones representing optically coded information associated with the object, wherein at least one zone of the first matrix of zones or the second matrix of zones is configured to absorb a predetermined first wavelength from electromagnetic radiation; wherein the first matrix of zones and the second matrix of zones have a first spatial resolution, and said substrate further comprises a calibrating layer having a second spatial resolution that is greater than the first spatial resolution; and a scanner configured to: receive a reflection of the electromagnetic radiation associated with at least one of the first matrix of zones and the second matrix of zones; and extract the optically coded information from a pattern created by wavelengths associated with the reflected electromagnetic radiation.

12

12. A system in accordance with claim 11 , wherein said encoded substrate further comprises a base layer extending under said second layer of material, said base layer configured to reflect the electromagnetic radiation.

13

13. A system in accordance with claim 12 , wherein said scanner is further configured to compare the reflected electromagnetic radiation with a database of values representing known information.

14

14. A system in accordance with claim 11 , wherein said substrate further comprises a base layer extending under said second layer of material, and said base layer is configured to reflect a first electromagnetic radiation emitted from a first source and a second electromagnetic radiation emitted from a second source in a common direction.

15

15. A system in accordance with claim 11 , wherein said substrate further comprises a base layer extending under said second layer of material, and said base layer is configured to reflect the electromagnetic radiation towards a source of the electromagnetic radiation.

16

16. A system in accordance with claim 11 , wherein the first matrix of zones and the second matrix of zones have a first spatial resolution, and said encoded substrate further comprises a calibrating layer having a second spatial resolution that is greater than the first spatial resolution.

17

17. A system in accordance with claim 11 , wherein said at least one zone is configured to indicate a change to at least one of the substrate, an environment of the substrate, and the object.

18

18. A system in accordance with claim 11 further comprising at least one of a tamper evident layer and a tamper proof layer.

19

19. A system in accordance with claim 11 , wherein said scanner is further configured to transmit the first wavelength of the electromagnetic radiation at a first time and transmit a predetermined second wavelength of the electromagnetic radiation at a second time, and at least one zone of the second matrix of zones is configured to absorb the second wavelength of the electromagnetic radiation.

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Patent Metadata

Filing Date

February 28, 2011

Publication Date

February 3, 2015

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Cite as: Patentable. “Optical interrogation and registration system” (US-8947204). https://patentable.app/patents/US-8947204

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