The present invention discloses a discrete three-dimensional vertical memory (3D-MV). It comprises at least a 3D-array die and at least a voltage-generator die. The 3D-array die comprises a plurality of vertical memory strings. At least a voltage-generator component for the 3D-array die is located on the voltage-generator die instead of the 3D-array die. The 3D-array die and the voltage-generator die have substantially different back-end-of-line (BEOL) structures.
Legal claims defining the scope of protection, as filed with the USPTO.
1. A discrete three-dimensional vertical memory (3D-M V ), comprising: a 3D-array die comprising a substrate and at least a 3D-M V array including a plurality of vertical memory strings, each of said vertical memory strings comprising a plurality of vertically stacked memory cells; a voltage-generator die comprising at least a portion of a voltage generator for providing said 3D-array die with at least a voltage other than the voltage supply, wherein said portion of said voltage generator is absent from said 3D-array die; wherein said 3D-array die comprises more back-end-of-line (BEOL) layers than said voltage-generator die; and, said 3D-array die and said voltage-generator die are separate dice.
2. The memory according to claim 1 , wherein each of said vertical memory strings includes a portion of said substrate.
3. The memory according to claim 1 , wherein each of said vertical memory strings is in contact with said substrate.
4. The memory according to claim 1 , wherein each of said vertically stacked memory cells comprises a vertical transistor.
5. The memory according to claim 1 , wherein said vertical transistor comprises a vertical channel.
6. The memory according to claim 1 , wherein each of said vertically stacked memory cells is a vertical-NAND cell.
7. The memory according to claim 1 , wherein said 3D-M V array does not comprise any under-array peripheral circuit.
8. The memory according to claim 1 , wherein said voltage-generator die comprises horizontal transistors.
9. The memory according to claim 1 , wherein said voltage generator comprises a read-voltage generator.
10. The memory according to claim 1 , wherein said voltage generator comprises a write-voltage generator.
11. The memory according to claim 1 , wherein said voltage generator comprises a band-gap reference generator.
12. The memory according to claim 1 , wherein said voltage generator comprises V R generator.
13. The memory according to claim 1 , wherein said voltage generator comprises a charge-pump circuit, a boost converter, a low-dropout regulator, or a buck converter.
14. The memory according to claim 1 , wherein said 3D-array die and said voltage-generator die are located in a memory package, a memory module, a memory card, or a solid-state drive.
15. The memory according to claim 1 , further comprising: another 3D-array die comprising another substrate and at least another 3D-M V array including another plurality of vertical memory strings; wherein said voltage-generator die comprises at least another portion of another voltage generator for said another 3D-array die.
16. The memory according to claim 15 , wherein each vertical memory string in said another 3D-array die includes another portion of said another substrate.
17. The memory according to claim 15 , wherein said another 3D-M V array does not comprise any under-array peripheral circuit.
18. The memory according to claim 15 , wherein said 3D-array die, said another 3D-array die and said voltage-generator die are located in a memory package, a memory module, a memory card, or a solid-state drive.
19. The memory according to claim 1 , wherein said 3D-M V is a three-dimensional read-only memory (3D-ROM) or a three-dimensional random-access memory (3D-RAM).
20. The memory according to claim 1 , wherein said 3D-M V is a 3D-memristor, 3D-RRAM or 3D-ReRAM, a 3D-PCM, a 3D-PMC, or a 3D-CBRAM.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
March 3, 2015
September 1, 2015
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