Embodiments of the present invention provide a thin film transistor and its manufacturing method, an array substrate and a display device, to improve the electrical performance of the thin film transistor and improve the picture quality of images displayed by the display device. The thin film transistor includes: a substrate; a gate, a source, a drain and a semiconductor layer formed on the substrate; a first gate protection layer; a gate isolation layer; and a second gate protection layer. The first gate protection layer is at least partly located between the gate and the semiconductor layer, and is an insulating layer. The gate isolation layer is at least partly located between the first gate protection layer and the second gate protection layer, and is a conductive layer. The second gate protection layer is at least partly located between the gate isolation layer and the semiconductor layer, and is an insulating layer.
Legal claims defining the scope of protection, as filed with the USPTO.
1. A thin film transistor, comprising: a substrate; a gate, a source, a drain and a semiconductor layer formed on the substrate; a first gate protection layer; a gate isolation layer; and a second gate protection layer, wherein the first gate protection layer is at least partly located directly between the gate and the gate isolation layer, and is an insulating layer, the gate isolation layer is at least partly located directly between the first gate protection layer and the second gate protection layer, and is a conductive layer, and the second gate protection layer is at least partly located directly between the gate isolation layer and the semiconductor layer, and is an insulating layer.
2. The thin film transistor according to claim 1 , wherein, the gate isolation layer is made of a transparent metallic oxide material, or the gate isolation layer is made of any one or any alloy of molybdenum, aluminum and niobium.
3. The thin film transistor according to claim 1 , wherein, a vertical projection of the gate isolation layer on the substrate overlaps with a vertical projection of the gate on the substrate.
4. The thin film transistor according to claim 1 , wherein, thickness of the second gate protection layer is less than that of the first gate protection layer.
5. The thin film transistor according to claim 1 , wherein, the gate is located on the substrate; the first gate protection layer at least cover the gate; the gate isolation layer is located on the first gate protection layer; the second gate protection layer at least cover the gate isolation layer; the semiconductor layer is located on the second gate protection layer; and the source and the drain are located at least partly on the semiconductor layer.
6. The thin film transistor according to the claim 5 , further comprising: a passivation layer, the passivation layer at least cover the source and the drain.
7. The thin film transistor according to claim 1 , wherein, the source and the drain are located on the substrate; the semiconductor layer at least partly covers the source and drain; the second gate protection layer at least covers the semiconductor layer; the gate isolation layer is located on the second gate protection layer; the first gate protection layer at least covers the gate isolation layer; and the gate is located on the first gate protection layer.
8. The thin film transistor according to claim 7 , further comprising: a passivation layer, the passivation layer at least covers the gate.
9. The thin film transistor according to claim 1 , wherein, a vertical projection of the gate isolation layer on the substrate exceeds a vertical projection of the semiconductor layer on the substrate; a vertical projection of the source and the drain on the substrate exceeds the vertical projection of the semiconductor layer on the substrate; the thin film transistor further comprises: a semiconductor layer protection layer, the semiconductor layer protection layer is an insulating layer and is at least partly located between a part of the gate isolation layer exceeding the semiconductor layer and a part of the source and the drain exceeding the semiconductor layer.
10. The thin film transistor according to claim 9 , wherein, the semiconductor layer protection layer at least partly contacts with the semiconductor layer, and the source and the drain are connected to the semiconductor layer through vias in the semiconductor layer protection layer.
11. The thin film transistor according to claim 1 , further comprising: a buffer layer, the buffer layer is positioned on a side where respective film layers of the thin film transistor are to be formed, of the substrate.
12. The thin film transistor according to claim 1 , wherein, the gate is made of copper.
13. An array substrate, comprising: the thin film transistor according to claim 1 ; a pixel electrode, the pixel electrode and the gate isolation layer are disposed on the same layer; and a gate line connected to the gate, and a vertical projection of the gate and gate line on the substrate does not exceed a vertical projection of the gate isolation layer on the substrate.
14. A display device, comprising the array substrate according to claim 13 .
15. A manufacturing method of a thin film transistor, comprising: a process of forming a gate, a source, a drain and a semiconductor layer; and a process of forming a first gate protection layer, a gate isolation layer, and a second gate protection layer; wherein, the first gate protection layer is at least partly located directly between the gate and the gate isolation layer, and is an insulating layer, the gate isolation layer is at least partly located directly between the first gate protection layer and the second gate protection layer, and is a conductive layer, and the second gate protection layer is at least partly located directly between the gate isolation layer and the semiconductor layer, and is an insulating layer.
16. The manufacturing method of the thin film transistor according to claim 15 wherein, the process of forming the gate, the source, the drain and the semiconductor layer and the process of forming the first gate protection layer, the gate isolation layer, and the second gate protection layer specifically comprise: forming the gate on a substrate using a patterning process; forming the first gate protection layer on the substrate with the gate formed thereon using the patterning process; forming the gate isolation layer on the substrate with the first gate protection layer formed thereon using the patterning process; forming the second gate protection layer on the substrate with the gate isolation layer formed thereon using the patterning process; forming the semiconductor layer on the substrate with the second gate protection layer formed thereon using the patterning process; forming the source and the drain on the substrate with the semiconductor layer formed thereon using the patterning process; and forming a passivation layer on the substrate with the source and the drain formed thereon, wherein, after forming the semiconductor layer and before forming the source and the drain, the manufacturing method further comprising: forming a semiconductor layer protection layer on the substrate with the semiconductor layer formed thereon using the patterning process, the source and the drain are formed on the semiconductor layer protection layer, and are connected to the semiconductor layer through vias in the semiconductor layer protection layer.
17. The manufacturing method of the thin film transistor according to the claim 15 , wherein, the process of forming the gate, the source, the drain and the semiconductor layer and the process of forming the first gate protection layer, the gate isolation layer and the second gate protection layer specifically comprise: forming the source and the drain on a substrate using a patterning process; forming a semiconductor layer on the substrate with the source and the drain formed thereon using the patterning process; forming the second gate protection layer on the substrate with the semiconductor layer formed thereon using the patterning process; forming the gate isolation layer on the substrate with the second gate protection layer formed thereon using the patterning process; forming the first gate protection layer on the substrate with the gate isolation layer formed thereon using the patterning process; forming the gate on the substrate with the first gate protection layer formed thereon using the patterning process; and forming a passivation layer on the substrate with the gate formed thereon, wherein, after forming the source and the drain and before forming the semiconductor layer, the manufacturing method further comprising: forming a semiconductor layer protection layer on the substrate with the source and the drain formed thereon, the semiconductor layer is formed on the semiconductor layer protection layer, and the source and the drain are connected to the semiconductor layer through vias in the semiconductor layer protection layer.
18. The manufacturing method of the thin film transistor according to claim 15 , wherein, before the process of forming the gate, the source, the drain and the semiconductor layer and the process of forming the first gate protection layer, the gate isolation layer and the second gate protection layer, furthering comprising: forming a buffer layer on the substrate.
19. The manufacturing method of the thin film transistor according to claim 15 , wherein, the thin film transistor is located in an array substrate, the array substrate further comprises a pixel electrode; forming the pixel electrode which is located on a same layer as the gate isolation layer at the same time when forming the gate isolation layer using the patterning process, the gate isolation layer and the pixel electrode are manufactured by using one-time patterning process.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
October 18, 2013
November 22, 2016
Browse 5M+ US patents with plain-English claim translations and AI-generated analysis.