Vertical type semiconductor device, fabrication method thereof and operation method thereof

1. A method of operating a vertical type semiconductor device which includes a pillar structure having a stacking structure of a conductive layer and a data storage material, a gate electrode formed to surround the data storage material of the pillar structure, and an interconnection layer electrically connected to the pillar structure and disposed on the pillar structure, the method comprising: applying a voltage for changing the data storage material into a high-resistance state to the gate electrode and the interconnection layer in response to an initialization command, wherein the data storage material is stacked over the conductive layer in a first direction, wherein the gate electrode is stacked over the data storage material in a second direction, and wherein the second direction is different from the first direction.

2. The method of claim 1 , further comprising: in response to a read command, applying a positive (+) voltage having a first level not to change a resistance state of the data storage material of a selected vertical type semiconductor device to the selected vertical type semiconductor device; and applying a positive (+) voltage having the first level or a second level higher than the first level to a gate electrode of the selected vertical type semiconductor device.

3. The method of claim 2 , further comprising: applying a ground voltage or a negative (−) voltage having a predetermined level to a gate electrode of a non-selected vertical type semiconductor device sharing the interconnection layer of the selected vertical type semiconductor device; applying the ground voltage to an interconnection layer of a non-selected vertical type semiconductor device sharing the gate electrode of the selected vertical type semiconductor device; and applying the ground voltage to an interconnection layer of a non-selected vertical type semiconductor device not sharing the interconnection layer and the gate electrode of the selected vertical type semiconductor device and applying the ground voltage or a negative (−) voltage having a predetermined level to a gate electrode thereof.

4. The method of claim 2 , further comprising: in response to a write command, applying a positive (+) voltage having the second level to the interconnection layer of the selected vertical type semiconductor device; and applying a positive (+) voltage having the second level or the first level lower than the second level to the gate electrode of the selected vertical type semiconductor device.

5. The method of claim 4 , further comprising: applying a ground voltage or a positive (+) voltage having a predetermined level to a gate electrode of a non-selected vertical type semiconductor device sharing the interconnection layer of the selected vertical type semiconductor device; applying the ground voltage to an interconnection of a non-selected vertical type semiconductor device sharing the gate electrode of the selected vertical type semiconductor device; and applying the ground voltage to an interconnection layer of a non-selected vertical type semiconductor device not sharing the interconnection layer and the gate electrode of the selected vertical type semiconductor device and applying the ground voltage or a negative (−) voltage having a predetermined level thereof.