An optoelectronic device comprises a substrate; pads on a surface of the substrate; semiconductor elements, each element resting on a pad; a portion covering at least the lateral sides of each pad, the portion preventing the growth of the semiconductor elements on the lateral sides; and a dielectric region extending in the substrate from the surface and connecting, for each pair of pads, one of the pads in the pair to the other pad in the pair. A method of manufacturing an optoelectronic device is also disclosed.
Legal claims defining the scope of protection, as filed with the USPTO.
1. An optoelectronic device comprising: a substrate; pads on a surface of the substrate; semiconductor elements, each element resting on a pad; a protection portion covering at least the lateral sides of each pad, said protection portion preventing growth of the semiconductor elements on the lateral sides; and a dielectric region extending in the substrate from said surface and connecting, for each pair of pads, one of the pads in the pair of pads to the other pad in the pair of pads.
2. The optoelectronic device of claim 1 , wherein the substrate is made of a first semiconductor material selected from the group comprising silicon, germanium, silicon carbide, a III-V compound, a II-VI compound, and a combination of these compounds.
3. The optoelectronic device of claim 2 , wherein each semiconductor element comprises at least a portion mainly comprising a second semiconductor material in contact with one of the pads, the second semiconductor material being selected from the group comprising silicon, germanium, silicon carbide, a III-V compound, a II-VI compound, and a combination of these compounds.
4. The optoelectronic device of claim 1 , wherein a thickness of each pad is in a range from 1 nm to 100 nm and wherein the substrate is in electric contact with each pad.
5. The optoelectronic device of claim 1 , wherein each semiconductor element is a microwire, a nanowire, a conical element, or a tapered element.
6. The optoelectronic device of claim 1 , wherein the protection portion is made of an insulating material.
7. A method of manufacturing an optoelectronic device comprising the successive steps of: providing a substrate; forming pads on a surface of the substrate; forming a protection portion covering at least the lateral sides of each pad and forming a dielectric region extending in the substrate from said surface and connecting, for each pair of pads, one of the pads in the pair of pads to the other pad in the pair of pads; and forming semiconductor elements, each element resting on a pad, said protection portion comprising a material preventing growth of the semiconductor elements on the lateral sides.
8. The method of claim 7 , wherein the protection portion is made of an insulating material.
9. The method of claim 7 , wherein the region is formed by oxidation or nitriding of the substrate.
10. The method of claim 9 , comprising the successive steps of: depositing a layer on the substrate; forming insulating blocks on the layer; etching the portions of the layer which are not covered with the insulating blocks to form the pads; oxidizing the sides of the pads and the substrate portions which are not covered with the pads; and removing the insulating blocks.
11. The method of claim 9 , comprising the successive steps of: depositing a layer on the substrate; forming insulating blocks on the layer; etching the portions of the layer which are not covered with the insulating blocks to form the pads; removing the insulating blocks; depositing a dielectric layer covering the pads and the substrate between the pads; anisotropically etching the dielectric layer to remove the dielectric layer from the substrate and from the top of the pads and leave portions of the dielectric layer on the lateral sides; and nitriding the substrate portions which are not covered with the pads.
12. The method of claim 11 , further comprising nitriding a top of each pad.
13. A method of manufacturing an optoelectronic device comprising the steps of: providing a substrate; depositing a layer on the substrate; forming insulating blocks on the layer; etching the portions of the layer which are not covered with the insulating blocks to form pads on a surface of the substrate; removing the insulating blocks; forming a protection portion covering at least the lateral sides of each pad and forming a dielectric region extending in the substrate from said surface and connecting, for each pair of pads, one of the pads in the pair of pads to the other pad in the pair of pads; and forming semiconductor elements, each element resting on a corresponding pad, said protection portion comprising a material preventing growth of the semiconductor elements on the lateral sides of the corresponding pad; oxidizing the sides of the pads and the substrate portions which are not covered with the pads.
14. The method of claim 13 , comprising the successive steps of: depositing a layer on the substrate; forming insulating blocks on the layer; etching the portions of the layer which are not covered with the insulating blocks to form the pads; removing the insulating blocks; depositing a dielectric layer covering the pads and the substrate between the pads; anisotropically etching the dielectric layer to remove the dielectric layer from the substrate and from the top of the pads and leave portions of the dielectric layer on the lateral sides; and nitriding the substrate portions which are not covered with the pads.
15. The method of claim 13 , further comprising nitriding a top of each pad.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
December 16, 2015
August 8, 2017
Browse 5M+ US patents with plain-English claim translations and AI-generated analysis.