A method of forming a pattern on a substrate comprises forming spaced, upwardly-open, cylinder-like structures projecting longitudinally outward of a base. Sidewall lining is formed over inner and over outer sidewalls of the cylinder-like structures, and that forms interstitial spaces laterally outward of the cylinder-like structures. The interstitial spaces are individually surrounded by longitudinally-contacting sidewall linings that are over outer sidewalls of four of the cylinder-like structures. Other embodiments are disclosed, including structure independent of method.
Legal claims defining the scope of protection, as filed with the USPTO.
1. A substrate mask pattern comprising: cylinder-like structures projecting longitudinally outward of a base over which the mask pattern lies, the cylinder-like structures being spaced from one another and individually comprising an upwardly-open cylinder-like chamber; and sidewall spacers over inner and outer sidewalls of the cylinder-like structures that form interstitial spaces laterally outward of the cylinder-like structures, the interstitial spaces being spaced from one another and individually surrounded by sidewall spacers that are over outer sidewalls of four different of the cylinder-like structures and contact one another along a majority of their longitudinal lengths.
2. The substrate mask of claim 1 wherein the cylinder-like structures are within openings in masking material.
3. The substrate mask of claim 1 wherein the cylinder-like structures are longitudinally longer than widest lateral thickness of their walls.
4. The substrate mask of claim 1 wherein the base comprises an elevationally outermost material of different composition from that of elevationally innermost material of the cylinder-like structures, the cylinder-like structures lying upon an elevationally outermost surface of the elevationally outermost material.
5. The substrate mask of claim 1 wherein the sidewall spacers are of the same composition as that of the cylinder-like structures.
6. The substrate mask of claim 1 wherein the sidewall spacers are of different composition from that of the cylinder-like structures.
7. The substrate mask of claim 1 wherein the sidewall spacers over the inner sidewalls form openings laterally inward of the cylinder-like structures, the interstitial spaces having respective shorter minimum open dimensions at an elevationally outermost surface of the sidewall spacers than those of the openings.
8. The substrate mask of claim 1 wherein the interstitial spaces are individually of quadrilateral cross-sectional shape with concave sidewalls.
9. The substrate mask of claim 8 wherein the interstitial spaces are individually of rectangular cross-sectional shape.
10. The substrate mask of claim 1 wherein the cylinder-like structures are in an oblique lattice pattern.
11. The substrate mask of claim 10 wherein the cylinder-like structures plus the sidewall spacers there-over and the spaces collectively form a square lattice pattern of openings.
12. The substrate mask of claim 1 wherein the cylinder-like structures have variable lateral wall thickness along their longitudinal lengths.
13. The substrate mask of claim 12 wherein the cylinder-like structures have constant lateral wall thickness along the majority of their longitudinal lengths.
14. The substrate mask of claim 12 wherein the walls of the cylinder-like structures are narrowest longitudinally-furthest from the base.
15. The substrate mask of claim 12 wherein the walls curve laterally outward longitudinally-furthest from the base.
16. The substrate mask of claim 1 wherein the base comprises an elevationally outermost material of different composition from that of elevationally innermost material of the cylinder-like structures, the cylinder-like structures extending elevationally into the elevationally outermost material.
17. The substrate mask of claim 16 wherein the elevationally outermost material of the base is directly against laterally innermost sidewalls of the cylinder-like structures.
18. The substrate mask of claim 16 wherein the elevationally outermost material of the base is not directly against laterally outermost sidewalls of the cylinder-like structures.
19. The substrate mask of claim 16 wherein the elevationally outermost material of the base is directly against laterally outermost sidewalls of the cylinder-like structures.
20. The substrate mask of claim 19 wherein the elevationally outermost material of the base is not directly against laterally innermost sidewalls of the cylinder-like structures.
21. The substrate mask of claim 19 wherein the elevationally outermost material of the base is directly against laterally innermost sidewalls of the cylinder-like structures.
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March 31, 2015
August 22, 2017
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