An object of the present invention is to provide a solid-state image capture element optical filter having excellent visible light transmission characteristics with reduced incidence angle dependence even in the near-ultraviolet wavelength region, in which the defects of conventional optical filters such as near-infrared cut filters are improved; and a device comprising the optical filter. The solid-state image capture element optical filter of the present invention comprises: a transparent resin substrate comprising a compound (X) having an absorption maximum in a wavelength range of 300 to 420 nm and a compound (Y) having an absorption maximum in a wavelength range of 600 to 800 nm; and a near infrared-reflecting film on at least one side of the substrate.
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1. A solid-state image capture element optical filter, comprising: a transparent resin substrate which comprises a compound (X) having an absorption maximum in a wavelength range of 300 to 420 nm and a compound (Y) having an absorption maximum in a wavelength range of 600 to 800 nm; and a near infrared-reflecting film on at least one side of said substrate; wherein an average transmittance in a wavelength range of 800 nm to 1,000 nm is at most 1%, wherein the average transmittance in the wavelength range of 800 nm to 1,000 nm is measured under a condition that an incidence angle of incoming light is perpendicular to the optical filter.
An optical filter for solid-state image capture elements consists of a transparent resin substrate. This substrate contains a compound (X) that absorbs light most strongly in the 300-420 nm range (near-UV) and a compound (Y) that absorbs light most strongly in the 600-800 nm range. A near-infrared reflecting film is applied to at least one side of the substrate. The filter is designed such that the average light transmittance between 800 nm and 1000 nm is no more than 1%, measured when light hits the filter at a perpendicular (90-degree) angle.
2. The solid-state image capture element optical filter according to claim 1 , wherein said compound (X) is at least one selected from the group consisting of azomethine-based compounds, indole-based compounds, benzotriazole-based compounds and triazine-based compounds.
This optical filter, as described as a filter for solid-state image capture elements consisting of a transparent resin substrate containing a compound (X) that absorbs light most strongly in the 300-420 nm range (near-UV) and a compound (Y) that absorbs light most strongly in the 600-800 nm range, and a near-infrared reflecting film applied to at least one side of the substrate, and the average light transmittance between 800 nm and 1000 nm being no more than 1% when light hits the filter perpendicularly, uses compound (X) which is one or more of the following: azomethine-based compounds, indole-based compounds, benzotriazole-based compounds, or triazine-based compounds.
3. The solid-state image capture element optical filter according to claim 1 , wherein a maximum absolute value (U) of a difference between the transmittance in the vertical direction in a wavelength region of ±20 nm from a wavelength (H) at which the transmission of the optical filter is 50% in a wavelength region of 300 to 450 nm and a transmittance at 30° with respect to the vertical direction in the same wavelength region is less than 25%.
This optical filter, as described as a filter for solid-state image capture elements consisting of a transparent resin substrate containing a compound (X) that absorbs light most strongly in the 300-420 nm range (near-UV) and a compound (Y) that absorbs light most strongly in the 600-800 nm range, and a near-infrared reflecting film applied to at least one side of the substrate, and the average light transmittance between 800 nm and 1000 nm being no more than 1% when light hits the filter perpendicularly, has a specific characteristic related to light angle. The maximum absolute difference (U) in transmittance is less than 25%. 'U' is the difference between the transmittance measured when light hits the filter perpendicularly versus at a 30-degree angle. This transmittance difference is measured within a +/- 20 nm range around the wavelength (H) where the filter's transmittance reaches 50% within the 300-450 nm range.
4. A solid-state imaging device, comprising the solid-state image capture element optical filter according to claim 1 .
A solid-state imaging device incorporates the optical filter described as a filter for solid-state image capture elements consisting of a transparent resin substrate containing a compound (X) that absorbs light most strongly in the 300-420 nm range (near-UV) and a compound (Y) that absorbs light most strongly in the 600-800 nm range, and a near-infrared reflecting film applied to at least one side of the substrate, and the average light transmittance between 800 nm and 1000 nm being no more than 1% when light hits the filter perpendicularly.
5. A camera module, comprising the solid-state image capture element optical filter according to claim 1 .
A camera module contains the optical filter described as a filter for solid-state image capture elements consisting of a transparent resin substrate containing a compound (X) that absorbs light most strongly in the 300-420 nm range (near-UV) and a compound (Y) that absorbs light most strongly in the 600-800 nm range, and a near-infrared reflecting film applied to at least one side of the substrate, and the average light transmittance between 800 nm and 1000 nm being no more than 1% when light hits the filter perpendicularly.
6. The solid-state image capture element optical filter according to claim 1 , wherein an average transmittance in a wavelength range of 430 nm to 580 nm is 84% to 91%, wherein the average transmittance in the wavelength range of 430 nm to 580 nm is measured under a condition that an incidence angle of incoming light is perpendicular to the optical filter.
This optical filter, as described as a filter for solid-state image capture elements consisting of a transparent resin substrate containing a compound (X) that absorbs light most strongly in the 300-420 nm range (near-UV) and a compound (Y) that absorbs light most strongly in the 600-800 nm range, and a near-infrared reflecting film applied to at least one side of the substrate, and the average light transmittance between 800 nm and 1000 nm being no more than 1% when light hits the filter perpendicularly, is characterized by an average light transmittance between 84% and 91% within the 430 nm to 580 nm wavelength range, measured with perpendicular light incidence.
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June 20, 2013
August 29, 2017
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