In one aspect, methods of determining the shape of a sessile drop are described herein. In some embodiments, a method described herein comprises measuring a first shape parameter of a sessile drop to obtain a first shape parameter value, measuring a second shape parameter of the drop to obtain a second shape parameter value, and using the first and second shape parameter values to calculate a third shape parameter value of a third shape parameter of the drop.
Legal claims defining the scope of protection, as filed with the USPTO.
Claim text for this patent isn't available yet.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
May 30, 2014
October 17, 2017
Browse 5M+ US patents with plain-English claim translations and AI-generated analysis.