A non-volatile storage apparatus comprises a controller, one or more memory packages, a system temperature sensor, and one or more memory temperature sensors. The system temperature sensor is located at or on the controller. Each of the one or more memory temperature sensors are positioned at one of the one or more memory packages. The controller monitors system temperature using the system temperature sensor. If the system temperature is above a first threshold, then temperature is sensed at the memory packages using the one or more memory temperature sensors. Individual memory packages have their performance throttled if their temperature exceeds a second threshold.
Legal claims defining the scope of protection, as filed with the USPTO.
1. A non-volatile storage apparatus, comprising: one or more control circuits; one or more memory packages connected to the one or more control circuits; a system temperature sensor connected to the one or more control circuits, the system temperature sensor is at a distance from each of the one or more memory packages; and one or more memory temperature sensors connected to the one or more control circuits, each of the one or more memory temperature sensors positioned at one of the one or more memory packages; the one or more control circuits are configured to monitor system temperature using the system temperature sensor, the one or more control circuits are configured to determine one or more memory temperature data values for each of the one or more memory packages using the one or more memory temperature sensors in reaction to determining that the system temperature exceeds a first threshold, the one or more control circuits are configured to individually throttle performance of one or more of the memory packages that have their temperature data value exceeding a second threshold.
2. The non-volatile storage apparatus of claim 1 , wherein: the one or more control circuits include a controller; the controller is physically separate from the one or more memory packages; the system temperature sensor is positioned at the controller and configured to measure temperature at the controller; and each of the one or more memory temperature sensors are positioned in and configured to measure temperature at one of the memory packages.
3. The non-volatile storage apparatus of claim 1 , wherein: the one or more memory packages comprises multiple memory packages that each have multiple memory dies; each memory die includes at least one memory temperature sensor; the one or more control circuits include a controller, the controller is implemented on a first die that is a separate die from any of the memory die; and the system temperature sensor is positioned at the controller and configured to measure temperature at the controller.
4. The non-volatile storage apparatus of claim 1 , wherein: the one or more memory packages comprises multiple memory packages that each have multiple memory dies; and the one or more control circuits are configured to individually throttle performance of one or more of the memory packages by throttling performance of all memory dies in the one or more of the memory packages.
5. The non-volatile storage apparatus of claim 1 , wherein: the one or more memory packages comprises multiple memory packages that each have multiple memory dies; each memory die includes at least one memory temperature sensor; and the one or more control circuits are configured to individually throttle performance of one or more of the memory packages by throttling performance of any memory die in the one or more of the memory packages that includes a memory temperature sensor that has sensed a memory temperature which exceeds the second threshold.
6. The non-volatile storage apparatus of claim 1 , wherein: the one or more control circuits are configured to individually throttle performance of one or more of the memory packages by reducing clock rate for a memory die in a memory package being throttled.
7. The non-volatile storage apparatus of claim 1 , wherein: the one or more control circuits are configured to individually throttle performance of one or more of the memory packages by reducing quantity of instructions per unit of time sent to a memory die in a memory package being throttled.
8. The non-volatile storage apparatus of claim 1 , wherein: the one or more memory packages each comprise multiple memory die; and the temperature sensors are positioned on the memory dies.
9. The non-volatile storage apparatus of claim 1 , wherein: the one or more memory packages each comprise multiple memory die that each have a separate temperature sensor so that multiple memory temperature values are generated for each of the one or more memory packages; and the one or more control circuits are configured to throttle performance of an individual memory package of the one or more memory packages when a mathematical function of the multiple memory temperature values for the individual memory package exceeds the second threshold.
10. The non-volatile storage apparatus of claim 1 , wherein: the one or more memory packages each comprise multiple memory die; each memory die includes at least one memory temperature sensor; and the one or more control circuits are configured to determine one or more memory temperature data values for each of the one or more memory packages by sensing temperature at each memory die of each memory package and identifying a maximum sensed temperature for each memory package.
11. The non-volatile storage apparatus of claim 1 , wherein: each of the one or more memory packages includes one or more monolithic three dimensional non-volatile memory structures; the one or more control circuits are configured to determine whether the system temperature exceeds a first threshold; the one or more control circuits include a controller; the controller is physically separate from the one or more memory packages; the system temperature sensor is positioned at the controller and configured to measure temperature at the controller; each of the one or more memory temperature sensors are positioned in and configured to measure temperature at one of the memory packages; and the controller, the one or more memory packages, the system temperature sensor and the one or more memory temperature sensors are part of a Solid State Drive.
12. A method for operating a non-volatile storage system, comprising: periodically monitoring temperature at a controller of the non-volatile storage system and determining whether the monitored temperature at the controller exceeds a first threshold; in reaction to determining that the monitored temperature at the controller exceeds the first threshold, sensing a temperature at a first memory die of the non-volatile storage system and determining whether the temperature sensed at the first memory die is greater than a second threshold; and in reaction to determining that the temperature sensed at the first memory die is greater than the second threshold, throttling performance of the memory die.
13. The method of claim 12 , further comprising: in reaction to determining that the monitored temperature at the controller exceeds the first threshold, sensing temperatures at multiple additional memory dies of the non-volatile storage system and determining whether the temperature sensed at the multiple additional memory dies are greater than the second threshold; and throttling performance of any of the multiple additional memory dies having a temperature greater than the second threshold.
14. The method of claim 12 , wherein: the sensing the temperature at the first memory die comprises sensing temperature at a first package, the first package includes the first memory die and multiple additional memory die; and the throttling performance of the memory die comprises the throttling performance of all memory dies of the first package.
15. A method for operating a non-volatile storage system, comprising: monitoring system temperature using a system sensor that is positioned off and at a distance away from one or more memory structures of the non-volatile storage system and determining whether the monitored system temperature exceeds a first threshold; in reaction to determining that the monitored system temperature exceeds the first threshold, sensing one or more memory temperatures using one or more sensors positioned at the one or more memory structures and determining whether the one or more memory temperatures exceeds a second threshold; and lowering performance of a particular memory structure of the one or more memory structures in response to determining that a particular temperature of the one or more temperatures sensed by a particular sensor of the one or more sensors that is positioned at the particular memory structure exceeds the second threshold.
16. The method of claim 15 , wherein: the monitoring system temperature comprises monitoring temperature of a controller; and the sensing one or more memory temperatures using one or more sensors positioned at the one or more memory structures comprises sensing temperatures of multiple memory dies in multiple packages.
17. The method of claim 15 , wherein: the sensing one or more memory temperatures using one or more sensors positioned at the one or more memory structures comprises sensing temperatures of multiple memory dies in multiple packages, determining a maximum temperature for each package and determining if the maximum temperatures exceed the second threshold; and lowering performance of a particular memory structure comprises lowering performance of all memory dies in a package having a maximum temperature that exceeds the second threshold.
18. The method of claim 15 , wherein: the sensing one or more memory temperatures using one or more sensors positioned at the one or more memory structures is only performed if the monitored system temperature exceeds the first threshold.
19. The method of claim 15 , further comprising: determining that the monitored system temperature exceeds the first threshold at a first time; determining that the monitored system temperature does not exceed the first threshold at a second time; and in reaction to determining that the monitored system temperature does not exceed the first threshold, operating without the sensing one or more memory temperatures using one or more sensors positioned at the one or more memory structures and determining whether the one or more memory temperatures exceeds a second threshold.
20. A non-volatile storage apparatus, comprising: one or more memory packages, each memory package comprises at least one monolithic three dimensional memory structure comprising a plurality of non-volatile memory cells; a system temperature sensor that is positioned off and at a distance away from the one or more memory packages; one or more memory temperature sensors, each of the one or more memory temperature sensors co-located at one of the one or more memory packages; means for monitoring temperature at the system temperature sensor and determining whether the monitored temperature at the system temperature sensor exceeds a first threshold; means for sensing temperature at the one or more memory temperature sensors only if it is determined that the monitored temperature at the system temperature sensor exceeds the first threshold; and means for throttling performance of a particular memory structure that is co-located with at least one of the memory temperature sensors that has a sensed temperature greater than a second threshold.
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October 14, 2016
November 7, 2017
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